Characterization of the structure in asphalts by employing x-ray technique

Abstract

Asphalt binder of five samples were taken from different parts of Canada. Thin films samples (l mm) were prepared by heating onto glass slides at 150°C for 10 min. Structural studies of asphalt in crude oil were performed by X-ray diffraction (XRD). The Jadeᵀᴹ software program was used for the initial analysis. XRD was performed with copper K-α radiation at 40 kV and 40 mA at a scan rate of 0.001° 2θ per second. The XRD data were first fitted with the Pearson VII features and then with pseudo-Voigt features and then modeled in the Mathematica© using the Fermi Generalized Function (GFF). The results are discussed in terms of their accuracy with different combinations of backgrounds such as (Linear, Level, Fixed, Parabolic, 3rd order Polynomial, 4th order Polynomial). The outcomes discussed are related to the accuracy of profile fitting when the exponents of Pearson VII and pseudo- Voigt Lorentzian differ. The Lorentzian values of Pseudo- Voigt are 0.4, 0.7, and 0.9 whereas the Exponent values of Pearson VII are 0.6, 0.8, and 1.2, and 3 backgrounds (4th order polynomial, 3rd order polynomial, and parabolic) were applied in profile fitting. Further, profile fitting and accuracy extend to crystallite parameters calculated results.