Migration by the diffraction stack method

Abstract

Computer programmes were developed to implement the diffraction stack migration scheme. In order to test the above technique, zero offset synthetic seismograms were generated for two simple models; a dipping layer and an anticline. Later the diffraction stack algorithm was applied to the field seismic data for the Adolphus structure. -- The general structure of the subsurface reflectors were better clarified in the migrated sections than the unmigrated sections for both synthetic and field seismic data. The anticline breadth was reduced in both synthetic and field migrated sections after collapsing the diffraction patterns generated at the sharp boundaries. The salt flank in Adolphus structure was delineated better than the original stacked section. It is also observed from migrated sections on the two synthetic models that the diffraction stack method works efficiently for steep dip reflectors up to dip angle 40 degrees.